4 results
A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 412-413
- Print publication:
- August 2020
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Automation of In-trench TEM Lamella Workflow Increasing Throughput for Lift-out
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1980-1981
- Print publication:
- August 2020
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Exploring Li distribution in Li-ion batteries with FIB-SEM and TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 370-371
- Print publication:
- August 2018
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Novel Setup for High Performance Simultaneous 3D EBSD and 3D EDS Acquisition
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 282-283
- Print publication:
- July 2017
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